| Автор | D M Pooke |
| Автор | N Paquin |
| Автор | M Pepper |
| Автор | A Gundlach |
| Дата выпуска | 1989-05-22 |
| dc.description | The authors report on measurements of the phase coherence time, tau <sub>phi </sub>, as determined from the measurement of weak negative magnetoresistance in narrow pinched Si accumulation layers. Under favourable bias conditions, one-dimensional quantum interference and electron interaction corrections to the conductivity are found. The phase coherence length is then best described in terms of the 1D Nyquist phase-breaking mechanism, with a Landau-Baber (pure metal limit) component which retains its 2D form. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Electron-electron scattering in narrow Si accumulation layers |
| Тип | lett |
| DOI | 10.1088/0953-8984/1/20/010 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 1 |
| Первая страница | 3289 |
| Последняя страница | 3293 |
| Аффилиация | D M Pooke; Cavendish Lab., Cambridge, UK |
| Аффилиация | N Paquin; Cavendish Lab., Cambridge, UK |
| Аффилиация | M Pepper; Cavendish Lab., Cambridge, UK |
| Аффилиация | A Gundlach; Cavendish Lab., Cambridge, UK |
| Выпуск | 20 |
