| Автор | R P Setna |
| Автор | T J Godfrey |
| Автор | G D W Smith |
| Дата выпуска | 1989-10-01 |
| dc.description | Vanadium specimens have been prepared and imaged for the first time in the field ion microscope. The composition of oxide films formed on vanadium at temperatures between 290 and 473 K has been determined by atom probe microanalysis. It is shown that the outer oxide film has a composition close to V<sub>2</sub>O<sub>3</sub> in this temperature range, and that an intermediate layer of suboxide of composition approximately V<sub>9</sub>O forms between the outer oxide and the metallic substrate. Appreciable solubility of oxygen in the vanadium metal matrix is also observed. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | A FIM atom probe study of vanadium oxidation |
| Тип | paper |
| DOI | 10.1088/0953-8984/1/SB/048 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 1 |
| Первая страница | SB215 |
| Последняя страница | SB216 |
| Аффилиация | R P Setna; Dept. of Metall. & Sci. of Mater., Oxford Univ., UK |
| Аффилиация | T J Godfrey; Dept. of Metall. & Sci. of Mater., Oxford Univ., UK |
| Аффилиация | G D W Smith; Dept. of Metall. & Sci. of Mater., Oxford Univ., UK |
| Выпуск | SB |
