Автор |
Alexander A Grabar |
Дата выпуска |
1998-03-16 |
dc.description |
It was revealed that specific directional light scattering takes place in ferroelectric semiconductors in polydomain states. This scattering is observed at to the light beam direction. The behaviour of this effect suggests that it is caused by light reflection by layers formed by charge carriers which screen charged domain walls between opposing domains. The orientation of the reflecting layers was determined. This effect allows one to check easily the degree of unipolarity throughout the sample and refine optically the complete crystallographic orientation. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
Directional light scattering by domain walls in uniaxial ferroelectrics |
Тип |
paper |
DOI |
10.1088/0953-8984/10/10/014 |
Electronic ISSN |
1361-648X |
Print ISSN |
0953-8984 |
Журнал |
Journal of Physics: Condensed Matter |
Том |
10 |
Первая страница |
2339 |
Последняя страница |
2346 |
Аффилиация |
Alexander A Grabar; Institute of Solid State Physics and Chemistry of Uzhgorod State University, Pidhirna 46, Uzhgorod, 294000, Ukraine |
Выпуск |
10 |