| Автор | J H Li |
| Автор | Y Yamaguchi |
| Автор | H Hashizume |
| Автор | N Usami |
| Автор | Y Shiraki |
| Дата выпуска | 1998-10-05 |
| dc.description | We report grazing-angle x-ray scattering investigations of interface morphologies in strained multilayers grown on vicinal Si(111) substrates. Samples with different Ge fractions in the alloy layers show a common feature of wavy interfaces arising from the substrate miscut and step bunching. They differ, however, quite remarkably in the wavy period. Our analyses show that the stress-driven step redistribution should take the responsibility for such behaviours of the interfaces. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Wavy interface morphologies in strained multilayers on vicinal Si(111) substrates |
| Тип | paper |
| DOI | 10.1088/0953-8984/10/39/003 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 10 |
| Первая страница | 8643 |
| Последняя страница | 8652 |
| Выпуск | 39 |
