| Автор | B D Fulthorpe |
| Автор | D E Joyce |
| Автор | T P A Hase |
| Автор | A S H Rozatian |
| Автор | B K Tanner |
| Автор | P J Grundy |
| Дата выпуска | 1999-11-01 |
| dc.description | The progression of interface structure through some Co/Cu and Co/Pt multilayer systems, grown on silicon and glass substrates respectively, has been studied using grazing incidence x-ray scattering. Simulations of the data shows that the interface characteristics of the Co/Cu system propagate unchanged with increasing numbers of bilayers. The interface roughness, lateral length scale and fractal dimension remain constant across the series of samples. In contrast, a reduction in the interface conformality between top and bottom surfaces with respect to increasing numbers of bilayers is observed in the Co/Pt system; however the roughness correlation between successive layers is largely maintained. Magnetization data for Co/Cu indicate that the Co layer immediately adjacent to the substrate is magnetically `dead'. This could result from mixing of the cobalt and silicon oxide species at the substrate interface. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films |
| Тип | paper |
| DOI | 10.1088/0953-8984/11/43/310 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 11 |
| Первая страница | 8477 |
| Последняя страница | 8487 |
| Выпуск | 43 |
