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Автор R Mustafa Öksüzoglu
Автор Ayhan Elmali
Автор Thomas E Weirich
Автор Hartmut Fuess
Автор Horst Hahn
Дата выпуска 2000-11-06
dc.description X-ray specular-reflectivity measurements have been carried out on Ag<sub>75</sub>Co<sub>25</sub> granular films which were sputter-deposited on Si substrates with SiO<sub>2</sub> surface, to investigate the evolution of surface roughness as a function of film thickness. X-ray reflectivity data were recorded for thicknesses of Ag<sub>75</sub>Co<sub>25</sub> thin films ranging from 8.8-116.9 nm. A power law behaviour of the interfacial width of a growing interface in sputtered-deposited Ag<sub>75</sub>Co<sub>25</sub> granular films was observed. The scaling exponent was found to be β = 0.43±0.01 and compared with theoretical calculations. High resolution electron microscopy revealed the presence of crystalline particles of fcc Ag and hcp Co. The structural and magnetoresistive properties of the films are discussed.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Evolution of the surface roughness (dynamic scaling) and microstructure of sputter-deposited Ag<sub>75</sub>Co<sub>25</sub> granular films
Тип paper
DOI 10.1088/0953-8984/12/44/306
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 12
Первая страница 9237
Последняя страница 9245
Аффилиация R Mustafa Öksüzoglu; Institute for Materials Science, Darmstadt University of Technology, Petersenstrasse 23, D-64287 Darmstadt, Germany
Аффилиация Ayhan Elmali; Institute for Materials Science, Darmstadt University of Technology, Petersenstrasse 23, D-64287 Darmstadt, Germany
Аффилиация Thomas E Weirich; Institute for Materials Science, Darmstadt University of Technology, Petersenstrasse 23, D-64287 Darmstadt, Germany
Аффилиация Hartmut Fuess; Institute for Materials Science, Darmstadt University of Technology, Petersenstrasse 23, D-64287 Darmstadt, Germany
Аффилиация Horst Hahn; Institute for Materials Science, Darmstadt University of Technology, Petersenstrasse 23, D-64287 Darmstadt, Germany
Выпуск 44

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