A study of the amorphisation reaction in Ni-Zr multilayers by neutron reflectometry
A Zarbakhsh; N Cowlam; R J Highmore; J E Evetts; J Penfold; C Shackleton; A Zarbakhsh; Dept. of Phys., Sheffield Univ., UK; N Cowlam; Dept. of Phys., Sheffield Univ., UK; R J Highmore; Dept. of Phys., Sheffield Univ., UK; J E Evetts; Dept. of Phys., Sheffield Univ., UK; J Penfold; Dept. of Phys., Sheffield Univ., UK; C Shackleton; Dept. of Phys., Sheffield Univ., UK
Журнал:
Journal of Physics: Condensed Matter
Дата:
1990-03-19
Аннотация:
The critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivity with wavelength observed for the samples shows very clearly a structure which changes during the reaction. This illustrates the considerable potential of the neutron reflectivity method.
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