| Автор | A Zarbakhsh |
| Автор | N Cowlam |
| Автор | R J Highmore |
| Автор | J E Evetts |
| Автор | J Penfold |
| Автор | C Shackleton |
| Дата выпуска | 1990-03-19 |
| dc.description | The critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivity with wavelength observed for the samples shows very clearly a structure which changes during the reaction. This illustrates the considerable potential of the neutron reflectivity method. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | A study of the amorphisation reaction in Ni-Zr multilayers by neutron reflectometry |
| Тип | paper |
| DOI | 10.1088/0953-8984/2/11/003 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 2 |
| Первая страница | 2537 |
| Последняя страница | 2545 |
| Аффилиация | A Zarbakhsh; Dept. of Phys., Sheffield Univ., UK |
| Аффилиация | N Cowlam; Dept. of Phys., Sheffield Univ., UK |
| Аффилиация | R J Highmore; Dept. of Phys., Sheffield Univ., UK |
| Аффилиация | J E Evetts; Dept. of Phys., Sheffield Univ., UK |
| Аффилиация | J Penfold; Dept. of Phys., Sheffield Univ., UK |
| Аффилиация | C Shackleton; Dept. of Phys., Sheffield Univ., UK |
| Выпуск | 11 |
