Characterization of the Si(111)-Ga interface using optical second-harmonic generation
P V Kelly; J D O'Mahony; T Rasing; J F McGilp; P V Kelly; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland; J D O'Mahony; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland; T Rasing; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland; J F McGilp; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland
Журнал:
Journal of Physics: Condensed Matter
Дата:
1991-11-01
Аннотация:
Ultra high-vacuum studies of optical second-harmonic generation (SHG) from well-characterized Si(111)-Ga interfaces in the submonolayer coverage regime are reported. Both intensity and phase measurements of the SH signal have been made. The chi <sub>xxx</sub> and chi <sub>xxx</sub> susceptibility tensor components are shown to have resonant enhancement around a third of a monolayer, for 1064 nm excitation. The origin of this behaviour is discussed in terms of the structure and bonding at the interface.
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