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Автор P V Kelly
Автор J D O'Mahony
Автор T Rasing
Автор J F McGilp
Дата выпуска 1991-11-01
dc.description Ultra high-vacuum studies of optical second-harmonic generation (SHG) from well-characterized Si(111)-Ga interfaces in the submonolayer coverage regime are reported. Both intensity and phase measurements of the SH signal have been made. The chi <sub>xxx</sub> and chi <sub>xxx</sub> susceptibility tensor components are shown to have resonant enhancement around a third of a monolayer, for 1064 nm excitation. The origin of this behaviour is discussed in terms of the structure and bonding at the interface.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Characterization of the Si(111)-Ga interface using optical second-harmonic generation
Тип paper
DOI 10.1088/0953-8984/3/S/031
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 3
Первая страница S193
Последняя страница S198
Аффилиация P V Kelly; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland
Аффилиация J D O'Mahony; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland
Аффилиация T Rasing; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland
Аффилиация J F McGilp; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland
Выпуск S

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