Автор |
P V Kelly |
Автор |
J D O'Mahony |
Автор |
T Rasing |
Автор |
J F McGilp |
Дата выпуска |
1991-11-01 |
dc.description |
Ultra high-vacuum studies of optical second-harmonic generation (SHG) from well-characterized Si(111)-Ga interfaces in the submonolayer coverage regime are reported. Both intensity and phase measurements of the SH signal have been made. The chi <sub>xxx</sub> and chi <sub>xxx</sub> susceptibility tensor components are shown to have resonant enhancement around a third of a monolayer, for 1064 nm excitation. The origin of this behaviour is discussed in terms of the structure and bonding at the interface. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
Characterization of the Si(111)-Ga interface using optical second-harmonic generation |
Тип |
paper |
DOI |
10.1088/0953-8984/3/S/031 |
Electronic ISSN |
1361-648X |
Print ISSN |
0953-8984 |
Журнал |
Journal of Physics: Condensed Matter |
Том |
3 |
Первая страница |
S193 |
Последняя страница |
S198 |
Аффилиация |
P V Kelly; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland |
Аффилиация |
J D O'Mahony; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland |
Аффилиация |
T Rasing; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland |
Аффилиация |
J F McGilp; Dept. of Pure & Appl. Phys., Dublin Univ., Ireland |
Выпуск |
S |