Electronic structure of HgBa<sub>2</sub>Ca<sub>2</sub>Cu<sub>3</sub>O<sub>8+ delta </sub>: the role of O(4) and high pressure
Hao Xuejun; Zhang Liyuan; Shen Jiang; Wang Huaiyu; Hao Xuejun; Dept. of Phys., Peking Univ., Beijing, China; Zhang Liyuan; Dept. of Phys., Peking Univ., Beijing, China; Shen Jiang; Dept. of Phys., Peking Univ., Beijing, China; Wang Huaiyu; Dept. of Phys., Peking Univ., Beijing, China
Журнал:
Journal of Physics: Condensed Matter
Дата:
1994-09-05
Аннотация:
The electronic structure of HgBa<sub>2</sub>Ca<sub>2</sub>Cu<sub>3</sub>O<sub>8+ delta </sub> with various delta (0, 0.12, 0.2 and 0.4) and pressures (ambient pressure, 5 GPa, 10 GPa and 20 GPa) has been calculated by the recursion method. Our results show that the electronic structure of this series is highly two dimensional with a large N(E<sub>F</sub>). The hole concentration of the CuO<sub>2</sub> layers and N (E<sub>F</sub>) increase monotonically as delta increases from 0 to 0.4. We thus suggest that the ideal delta should be 0.4. With increasing pressure, the hole concentration increases further and E<sub>F</sub> rises. The relationship between T<sub>c</sub> and pressure can be described by the same model of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7- delta </sub>.
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