| Автор | W B Zhao |
| Автор | J Chen |
| Автор | K Wu |
| Автор | J L Zhang |
| Автор | C Y Li |
| Автор | D L Yin |
| Автор | Z N Gu |
| Автор | H Zhou |
| Автор | Z X Jin |
| Дата выпуска | 1994-10-10 |
| dc.description | The two-dimensional doping by charge transfer and/or diffusion of metal atoms into C<sub>60</sub> has been studied by in situ electronic transport measurements during the deposition of metal-C<sub>60</sub> ultrathin bilayers. The results show that the transport properties of these interfacial systems are significantly altered by such doping processes. Some useful information about the charge transfer from metal to C<sub>60</sub> and the electronic transport properties of the metal-doped-monolayer C<sub>60</sub> can be obtained after careful analysis. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | In situ electronic transport measurement as a tool for investigating the 2D doping in metal-C<sub>60</sub> interfacial systems |
| Тип | lett |
| DOI | 10.1088/0953-8984/6/41/002 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 6 |
| Первая страница | L631 |
| Последняя страница | L636 |
| Аффилиация | W B Zhao; Dept. of Phys., Peking Univ., Beijing, China |
| Аффилиация | J Chen; Dept. of Phys., Peking Univ., Beijing, China |
| Аффилиация | K Wu; Dept. of Phys., Peking Univ., Beijing, China |
| Аффилиация | J L Zhang; Dept. of Phys., Peking Univ., Beijing, China |
| Аффилиация | C Y Li; Dept. of Phys., Peking Univ., Beijing, China |
| Аффилиация | D L Yin; Dept. of Phys., Peking Univ., Beijing, China |
| Аффилиация | Z N Gu; Dept. of Phys., Peking Univ., Beijing, China |
| Аффилиация | H Zhou; Dept. of Phys., Peking Univ., Beijing, China |
| Аффилиация | Z X Jin; Dept. of Phys., Peking Univ., Beijing, China |
| Выпуск | 41 |
