Calibration of CR-39 and ZnP-glass detectors with 350 MeV <sup>90</sup>Zr ions
J Raju; S Ghosh; A Saxena; K K Dwivedi; J Raju; Dept. of Chem., North-Eastern Hill Univ., Shillong, India; S Ghosh; Dept. of Chem., North-Eastern Hill Univ., Shillong, India; A Saxena; Dept. of Chem., North-Eastern Hill Univ., Shillong, India; K K Dwivedi; Dept. of Chem., North-Eastern Hill Univ., Shillong, India
Журнал:
Measurement Science and Technology
Дата:
1990-09-01
Аннотация:
The response of sensitive detectors, CR-39 and ZnP-glass, for 350 MeV <sup>90</sup>Zr ions, has been studied. Bulk and track-etch parameters have been evaluated by successive etching. Calibration of the two detectors has been done by correlating the measured track-etch rate (V<sub>T</sub>) with the residual range and total energy-loss rate. A linear correlation has been observed in both cases. Track registration threshold values of 4.45 MeV mg<sup>-1</sup> cm<sup>2</sup> for CR-39 and 12.50 MeV mg<sup>-1</sup> cm<sup>2</sup> for ZnP-glass have been obtained.
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