| Автор | J Raju |
| Автор | S Ghosh |
| Автор | A Saxena |
| Автор | K K Dwivedi |
| Дата выпуска | 1990-09-01 |
| dc.description | The response of sensitive detectors, CR-39 and ZnP-glass, for 350 MeV <sup>90</sup>Zr ions, has been studied. Bulk and track-etch parameters have been evaluated by successive etching. Calibration of the two detectors has been done by correlating the measured track-etch rate (V<sub>T</sub>) with the residual range and total energy-loss rate. A linear correlation has been observed in both cases. Track registration threshold values of 4.45 MeV mg<sup>-1</sup> cm<sup>2</sup> for CR-39 and 12.50 MeV mg<sup>-1</sup> cm<sup>2</sup> for ZnP-glass have been obtained. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Calibration of CR-39 and ZnP-glass detectors with 350 MeV <sup>90</sup>Zr ions |
| Тип | paper |
| DOI | 10.1088/0957-0233/1/9/012 |
| Electronic ISSN | 1361-6501 |
| Print ISSN | 0957-0233 |
| Журнал | Measurement Science and Technology |
| Том | 1 |
| Первая страница | 903 |
| Последняя страница | 907 |
| Аффилиация | J Raju; Dept. of Chem., North-Eastern Hill Univ., Shillong, India |
| Аффилиация | S Ghosh; Dept. of Chem., North-Eastern Hill Univ., Shillong, India |
| Аффилиация | A Saxena; Dept. of Chem., North-Eastern Hill Univ., Shillong, India |
| Аффилиация | K K Dwivedi; Dept. of Chem., North-Eastern Hill Univ., Shillong, India |
| Выпуск | 9 |
