Doppler-tuned x-ray spectrometer: outlook of application to experiments at the ion source beams
I V Ryzhov; G A Tutin; I V Ryzhov; Khlopin Radium Institute, 2-nd Murinski Av. 28, 194021, Saint-Petersburg, Russia; G A Tutin; Khlopin Radium Institute, 2-nd Murinski Av. 28, 194021, Saint-Petersburg, Russia
Журнал:
Physica Scripta
Дата:
1997-01-01
Аннотация:
In this paper we propose to use a Doppler-turned x-ray spectrometer for precision experiments at beams extracted from ion sources. In contrast to the conventional crystal-diffraction devices this technique provides a high resolving power without considerable losses in efficiency.
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