Автор |
I V Ryzhov |
Автор |
G A Tutin |
Дата выпуска |
1997-01-01 |
dc.description |
In this paper we propose to use a Doppler-turned x-ray spectrometer for precision experiments at beams extracted from ion sources. In contrast to the conventional crystal-diffraction devices this technique provides a high resolving power without considerable losses in efficiency. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
Doppler-tuned x-ray spectrometer: outlook of application to experiments at the ion source beams |
Тип |
paper |
DOI |
10.1088/0031-8949/1997/T71/031 |
Electronic ISSN |
1402-4896 |
Print ISSN |
0031-8949 |
Журнал |
Physica Scripta |
Том |
1997 |
Первая страница |
161 |
Последняя страница |
163 |
Аффилиация |
I V Ryzhov; Khlopin Radium Institute, 2-nd Murinski Av. 28, 194021, Saint-Petersburg, Russia |
Аффилиация |
G A Tutin; Khlopin Radium Institute, 2-nd Murinski Av. 28, 194021, Saint-Petersburg, Russia |
Выпуск |
T71 |