Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method
Cheng Chuan-Fu; Liu Chun-Xiang; Teng Shu-yun; Zhang Ning-Yu; Li Ru-Xin; Xu Zhi-Zhan
Журнал:
Chinese Physics Letters
Дата:
2002-09-01
Аннотация:
Theoretical analysis shows that the deviation roughness w and the lateral correlation length ξ of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. Experimentally, we have measured the data of the speckle contrast versus the radius R of the variable filtering aperture. By fitting the theoretical results to these data, we extract the parameters w and ξ of the random surfaces with Gaussian correlation. This method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed.
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