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Автор Cheng Chuan-Fu
Автор Liu Chun-Xiang
Автор Teng Shu-yun
Автор Zhang Ning-Yu
Автор Li Ru-Xin
Автор Xu Zhi-Zhan
Дата выпуска 2002-09-01
dc.description Theoretical analysis shows that the deviation roughness w and the lateral correlation length ξ of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. Experimentally, we have measured the data of the speckle contrast versus the radius R of the variable filtering aperture. By fitting the theoretical results to these data, we extract the parameters w and ξ of the random surfaces with Gaussian correlation. This method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method
Тип paper
DOI 10.1088/0256-307X/19/9/320
Electronic ISSN 1741-3540
Print ISSN 0256-307X
Журнал Chinese Physics Letters
Том 19
Первая страница 1283
Последняя страница 1286
Выпуск 9

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