In the resonant Raman scattering (RRS) process the emitted photon exhibits a continuous energy distribution with a high energy cutoff limit. This cutoff energy depends on the chemical state of the element under examination. In the present work, the possibility of identifying the chemical state of V atoms by employing RRS spectroscopy with a semiconductor Si(Li) detector is investigated. A proton induced Cr Kα x-ray beam was used as the incident radiation, having a fixed energy lower than the V K-absorption edge. The net RRS distributions extracted from the energy dispersive spectra of metallic V and its compound targets were simulated by an appropriate theoretical model. The results showed the possibility of employing RRS spectroscopy with a semiconductor detector for chemical speciation studies.