| Автор | A G Karydas |
| Автор | S Galanopoulos |
| Автор | Ch Zarkadas |
| Автор | T Paradellis |
| Автор | N Kallithrakas-Kontos |
| Дата выпуска | 2002-12-02 |
| dc.description | In the resonant Raman scattering (RRS) process the emitted photon exhibits a continuous energy distribution with a high energy cutoff limit. This cutoff energy depends on the chemical state of the element under examination. In the present work, the possibility of identifying the chemical state of V atoms by employing RRS spectroscopy with a semiconductor Si(Li) detector is investigated. A proton induced Cr Kα x-ray beam was used as the incident radiation, having a fixed energy lower than the V K-absorption edge. The net RRS distributions extracted from the energy dispersive spectra of metallic V and its compound targets were simulated by an appropriate theoretical model. The results showed the possibility of employing RRS spectroscopy with a semiconductor detector for chemical speciation studies. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Chemical state speciation by resonant Raman scattering |
| Тип | paper |
| DOI | 10.1088/0953-8984/14/47/311 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 14 |
| Первая страница | 12367 |
| Последняя страница | 12381 |
| Выпуск | 47 |
