Application of three-dimensional electron tomography using bright-field imaging—Two types of Si-phases in Al–Si alloy
Kaneko, Kenji; Nagayama, Ryo; Inoke, Koji; Noguchi, Etsuko; Horita, Zenji; Kaneko, Kenji; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan;; Nagayama, Ryo; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan; Inoke, Koji; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan; FEI Company Japan Ltd., 13-34, Kohnan 2, Minato-ku, Tokyo 108-0075, Japan; Noguchi, Etsuko; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan; Horita, Zenji; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan
Журнал:
Science and Technology of Advanced Materials
Дата:
2006-10-31
Аннотация:
When a dilute amount of Si is added to Al, it results in the precipitation of Si-phases, either planar- and/or rod-type, depending on the ageing conditions. Observation of these phases had been carried out by TEM two dimensionally so far; nevertheless information of the thickness as well as the distribution had been neglected in the past. In this paper, a combination of electron diffraction, high-resolution transmission electron microscopy, and three-dimensional electron tomography was applied to characterize the morphologies and the orientation relationship of the Si-phases in an Al–Si alloy.
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