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Автор Kaneko, Kenji
Автор Nagayama, Ryo
Автор Inoke, Koji
Автор Noguchi, Etsuko
Автор Horita, Zenji
Дата выпуска 2006-10-31
dc.description When a dilute amount of Si is added to Al, it results in the precipitation of Si-phases, either planar- and/or rod-type, depending on the ageing conditions. Observation of these phases had been carried out by TEM two dimensionally so far; nevertheless information of the thickness as well as the distribution had been neglected in the past. In this paper, a combination of electron diffraction, high-resolution transmission electron microscopy, and three-dimensional electron tomography was applied to characterize the morphologies and the orientation relationship of the Si-phases in an Al–Si alloy.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт © 2006 NIMS and Elsevier Ltd
Название Application of three-dimensional electron tomography using bright-field imaging—Two types of Si-phases in Al–Si alloy
Тип paper
DOI 10.1016/j.stam.2006.06.006
Electronic ISSN 1878-5514
Print ISSN 1468-6996
Журнал Science and Technology of Advanced Materials
Том 7
Первая страница 726
Последняя страница 731
Аффилиация Kaneko, Kenji; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan;
Аффилиация Nagayama, Ryo; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan
Аффилиация Inoke, Koji; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan; FEI Company Japan Ltd., 13-34, Kohnan 2, Minato-ku, Tokyo 108-0075, Japan
Аффилиация Noguchi, Etsuko; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan
Аффилиация Horita, Zenji; Department of Material Science and Engineering, Kyushu University, 744, Motooka, Nishi, Fukuoka 819-0395, Japan
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