| Автор | Liu, Tao |
| Автор | Raabe, Dierk |
| Автор | Zaefferer, Stefan |
| Дата выпуска | 2008-09-01 |
| dc.description | We have studied the nucleation and growth processes in a chemical vapor deposition (CVD) diamond film using a tomographic electron backscattering diffraction method (3D EBSD). The approach is based on the combination of a focused ion beam (FIB) unit for serial sectioning in conjunction with high-resolution EBSD. Individual diamond grains were investigated in 3-dimensions particularly with regard to the role of twinning. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | 2008 National Institute for Materials Science |
| Название | A 3D tomographic EBSD analysis of a CVD diamond thin film |
| Тип | paper |
| DOI | 10.1088/1468-6996/9/3/035013 |
| Electronic ISSN | 1878-5514 |
| Print ISSN | 1468-6996 |
| Журнал | Science and Technology of Advanced Materials |
| Том | 9 |
| Первая страница | 35013 |
| Последняя страница | 35018 |
| Аффилиация | Liu, Tao; Max-Planck-Institut für Eisenforschung, Abteilung Mikrostrukturphysik und Umformtechnik, Max-Planck-Strasse 1, 40237 Düsseldorf, Germany |
| Аффилиация | Raabe, Dierk; Max-Planck-Institut für Eisenforschung, Abteilung Mikrostrukturphysik und Umformtechnik, Max-Planck-Strasse 1, 40237 Düsseldorf, Germany |
| Аффилиация | Zaefferer, Stefan; Max-Planck-Institut für Eisenforschung, Abteilung Mikrostrukturphysik und Umformtechnik, Max-Planck-Strasse 1, 40237 Düsseldorf, Germany |
| Выпуск | 3 |
