Application of dynamic impedance spectroscopy to atomic force microscopy
Darowicki, Kazimierz; Zieliński, Artur; J Kurzydłowski, Krzysztof; Darowicki, Kazimierz; Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza Street 11/12, 80-952 Gdańsk Wrzeszcz, Poland; Zieliński, Artur; Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza Street 11/12, 80-952 Gdańsk Wrzeszcz, Poland; J Kurzydłowski, Krzysztof; Department of Materials Engineering, Warsaw University of Technology, Wołoska Street 144, 02-507 Warsaw, Poland
Журнал:
Science and Technology of Advanced Materials
Дата:
2008-12-01
Аннотация:
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.
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