| Автор | Darowicki, Kazimierz |
| Автор | Zieliński, Artur |
| Автор | J Kurzydłowski, Krzysztof |
| Дата выпуска | 2008-12-01 |
| dc.description | Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | 2008 National Institute for Materials Science |
| Название | Application of dynamic impedance spectroscopy to atomic force microscopy |
| Тип | paper |
| DOI | 10.1088/1468-6996/9/4/045006 |
| Electronic ISSN | 1878-5514 |
| Print ISSN | 1468-6996 |
| Журнал | Science and Technology of Advanced Materials |
| Том | 9 |
| Первая страница | 45006 |
| Последняя страница | 45010 |
| Аффилиация | Darowicki, Kazimierz; Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza Street 11/12, 80-952 Gdańsk Wrzeszcz, Poland |
| Аффилиация | Zieliński, Artur; Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza Street 11/12, 80-952 Gdańsk Wrzeszcz, Poland |
| Аффилиация | J Kurzydłowski, Krzysztof; Department of Materials Engineering, Warsaw University of Technology, Wołoska Street 144, 02-507 Warsaw, Poland |
| Выпуск | 4 |
