Influence of the preparation method on the As-Se-AgI thin films behaviour
T Hineva; T Petkova; P Petkov; V Mikli; G Socol; C N Mihailescu; I N Mihailescu
Журнал:
Journal of Physics: Conference Series
Дата:
2008-05-01
Аннотация:
Bulk glasses of the (As<sub>2</sub>Se<sub>3</sub>)<sub>1-x</sub> (AgI)<sub>x</sub> and (AsSe)<sub>1-x</sub>(AgI)<sub>x</sub> systems, where x 5, 10, 15 up to 35 mol.% have been prepared by the melt-quenched technique. The thin films have been deposited by means of vacuum thermal evaporation (VTE) and pulsed laser deposition (PLD). The XRD investigation reveals a generally amorphous structure; small peaks are only observed in the samples with the highest AgI. The film compositions have been determined by EDS (energy dispersive X-ray microanalysis). WDS (wavelength dispersive spectroscopy) studies have shown that the films do not contain oxygen within the accuracy of the method (1 %). The films are dense with smooth surface as revealed by using scanning electron microscopy (SEM) and atomic force microscopy (AFM).
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