| Автор | T Hineva |
| Автор | T Petkova |
| Автор | P Petkov |
| Автор | V Mikli |
| Автор | G Socol |
| Автор | C N Mihailescu |
| Автор | I N Mihailescu |
| Дата выпуска | 2008-05-01 |
| dc.description | Bulk glasses of the (As<sub>2</sub>Se<sub>3</sub>)<sub>1-x</sub> (AgI)<sub>x</sub> and (AsSe)<sub>1-x</sub>(AgI)<sub>x</sub> systems, where x 5, 10, 15 up to 35 mol.% have been prepared by the melt-quenched technique. The thin films have been deposited by means of vacuum thermal evaporation (VTE) and pulsed laser deposition (PLD). The XRD investigation reveals a generally amorphous structure; small peaks are only observed in the samples with the highest AgI. The film compositions have been determined by EDS (energy dispersive X-ray microanalysis). WDS (wavelength dispersive spectroscopy) studies have shown that the films do not contain oxygen within the accuracy of the method (1 %). The films are dense with smooth surface as revealed by using scanning electron microscopy (SEM) and atomic force microscopy (AFM). |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | © 2008 IOP Publishing Ltd |
| Название | Influence of the preparation method on the As-Se-AgI thin films behaviour |
| Тип | paper |
| DOI | 10.1088/1742-6596/113/1/012023 |
| Electronic ISSN | 1742-6596 |
| Print ISSN | 1742-6588 |
| Журнал | Journal of Physics: Conference Series |
| Том | 113 |
| Первая страница | 12023 |
| Последняя страница | 12027 |
| Выпуск | 1 |
