X-ray reflectivity is sensitive to slight structural changes along the depth of layered materials in the order of sub-nanometers or even smaller. This property is extremely promising for the observation of buried interfaces, but the conventional X-ray reflectivity technique unfortunately lacks spatial resolution. The method looks at quite a large area, typically mm²∼ cm²of the sample, and this often makes it difficult to analyze realistic problems in modern nano sciences and technologies. The present article discusses instrumentation for upgrading the X-ray reflectivity technique to give it a much higher spatial resolution. Recent preliminary results with high-energy white X-rays are reported.