| Автор | Kenji Sakurai |
| Автор | Mari Mizusawa |
| Автор | Masashi Ishii |
| Автор | Shun-ichi Kobayashi |
| Автор | Yasuhiko Imai |
| Дата выпуска | 2007-10-01 |
| dc.description | X-ray reflectivity is sensitive to slight structural changes along the depth of layered materials in the order of sub-nanometers or even smaller. This property is extremely promising for the observation of buried interfaces, but the conventional X-ray reflectivity technique unfortunately lacks spatial resolution. The method looks at quite a large area, typically mm<sup>2</sup>∼ cm<sup>2</sup>of the sample, and this often makes it difficult to analyze realistic problems in modern nano sciences and technologies. The present article discusses instrumentation for upgrading the X-ray reflectivity technique to give it a much higher spatial resolution. Recent preliminary results with high-energy white X-rays are reported. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | © 2007 IOP Publishing Ltd |
| Название | Instrumentation for X-ray reflectivity in micro area: present status and future outlook |
| Тип | paper |
| DOI | 10.1088/1742-6596/83/1/012001 |
| Electronic ISSN | 1742-6596 |
| Print ISSN | 1742-6588 |
| Журнал | Journal of Physics: Conference Series |
| Том | 83 |
| Первая страница | 12001 |
| Последняя страница | 12007 |
| Выпуск | 1 |
