Control of interface properties, layer quality and interdiffusion in selected nanoscaled heterostructures
Kim-Ngan, Nhu-T H; Kim-Ngan, Nhu-T H; Institute of Physics, Pedagogical University, 30-084 Kraków, Poland; Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 5, 12116 Prague, Czech Republic
Журнал:
Advances in Natural Sciences: Nanoscience and Nanotechnology
Дата:
2010-12-01
Аннотация:
Applications of ion beam techniques (IBA and IBMM) on nanoscaled thin films of selected materials (e.g. magnetite Fe<sub>3</sub>O<sub>4</sub>, uranium nitride UN) are presented. 1 MeV Ar<sup>+</sup> and Kr<sup>+</sup> ion beam with different ion fluences in the range of 10<sup>15</sup>–10<sup>17</sup> ions cm<sup>−2</sup> have been used to modify the film interfaces. Selected heterostructure interfaces were treated by subsequent thermal annealing. By analyzing the results obtained for the films in three different states (as-deposition, after annealing and after ion irradiation), the effects of ion beam mixing and interdiffusion were determined.
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