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Автор ALLEN, A. J.
Автор BUTILE, D. J.
Дата выпуска 1992
dc.description AbstractThere is an increasing number of industrial applications where the performance of either existing or new specialised materials, often in hostile operating conditions, is critical to safe operation. There is frequently a need for both rigorous quality control in production and careful inspection throughout service-life. Unfortunately. changes in microstructure during fabrication or in service can have unpredictably deleterious effects on overall material or component performance. It is therefore essential to have non-destructive measurement techniques to relate microstructural effects to bulk properties. In this paper. a number of selected microstructural and NDE techniques (some novel) are reviewed, and their results are interrelated to show where such combinations of diagnostic methods make possible more complete assessments of component material microstructure and performance during service life.
Формат application.pdf
Издатель Taylor & Francis Group
Копирайт Copyright Taylor and Francis Group, LLC
Тема Systems approach
Тема microstructural NDE
Тема radiation damage
Тема plastic damage
Тема residual stress
Тема surface finishing
Название FROM MICROSTRUCTURAL ASSESSMENT TO MONITORING COMPONENT PERFORMANCE – A REVIEW RELATING DIFFERENT NON-DESTRUCTIVE STUDIESFROM MICROSTRUCTURAL ASSESSMENT TO MONITORING COMPONENT PERFORMANCE – A REVIEW RELATING DIFFERENT NON-DESTRUCTIVE STUDIESFROM MICROSTRUCTURAL ASSESSMENT TO MONITORING COMPONENT PERFORMANCE – A REVIEW RELATING DIFFERENT NON-DESTRUCTIVE STUDIESFROM MICROSTRUCTURAL ASSESSMENT TO MONITORING COMPONENT PERFORMANCE – A REVIEW RELATING DIFFERENT NON-DESTRUCTIVE STUDIES
Тип research-article
DOI 10.1080/10589759208952985
Electronic ISSN 1477-2671
Print ISSN 1058-9759
Журнал Nondestructive Testing and Evaluation
Том 7
Первая страница 9
Последняя страница 30
Аффилиация ALLEN, A. J.; National NDT Centre, B521, Harwell Laboratory, AEA Technology
Аффилиация BUTILE, D. J.; National NDT Centre, B521, Harwell Laboratory, AEA Technology
Выпуск 1-6

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