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Автор Cerezo, A.
Автор Larson, D. J.
Автор Smith, G. D. W.
Дата выпуска 2001
dc.description Exactly 50 years ago, E.W. Müller became the first person to observe single atoms, with the aid of the field-ion microscope (FIM). In 1967, with John Panitz and S. Brooks McLane, Müller's invention of the atom probe meant that, in his words, “We can now really deal much more intimately with the individual atoms which we encounter, since we know their names.” By combining position-sensitive detection with the time-of-flight mass spectrometry of single atoms in the atom probe, Cerezo and co-workers in the late 1980s built an instrument capable of reconstructing the three-dimensional (3D) atomic distribution of elements present in a material. The instruments that are capable of microanalysis at this level, called generically 3D atom probes (3DAPs), were the subject of two articles published in MRS Bulletin in 1994. In this article, we review some of the progress in the field since that time, in particular, the expansion of the range of materials problems that can be addressed by this powerful technique.
Формат application.pdf
Издатель Cambridge University Press
Копирайт Copyright © Materials Research Society 2001
Тема Technical Feature
Название Progress in the Atomic-Scale Analysis of Materials with the Three-Dimensional Atom Probe
Тип research-article
DOI 10.1557/mrs2001.296
Electronic ISSN 1938-1425
Print ISSN 0883-7694
Журнал MRS Bulletin
Том 26
Первая страница 102
Последняя страница 107
Выпуск 2

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