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Автор Marie-Joseph, I.
Автор Oukaour, A.
Автор Clergeot, H.
Автор Primerose, A.
Дата выпуска 2000
dc.description This article presents a binary classification method which is used in defects detection. It's presented as recursives “boosting” algorithms which allow us to obtain a precise discriminating function by combination of hypothesis and rules with moderate accuracy. This approach permits the study of random phenomena governed by nonparametric laws and a direct decision for the observations classification and the determination of frontiers in an observation space. The various analyses which will be developed are illustrated by simulations making it possible to evaluate the possibilities of the method.
Формат application.pdf
Издатель EDP Sciences
Копирайт © EDP Sciences, 2000
Название A binary classification methodology applicable to defects detection. Boosting algorithms
Тип research-article
DOI 10.1051/epjap:2000172
Electronic ISSN 1286-0050
Print ISSN 1286-0042
Журнал The European Physical Journal Applied Physics
Том 12
Первая страница 61
Последняя страница 74
Аффилиация Marie-Joseph I.; Laboratoire de Traitement du Signal et de Modélisation des Machines, Institut d'Études Supérieures de la Guyane, avenue d'Estrée, BP 792, 97337 Cayenne Cedex, France
Аффилиация Oukaour A.; Laboratoire de Traitement du Signal et de Modélisation des Machines, Institut d'Études Supérieures de la Guyane, avenue d'Estrée, BP 792, 97337 Cayenne Cedex, France
Аффилиация Clergeot H.; Laboratoire de Traitement du Signal et de Modélisation des Machines, Institut d'Études Supérieures de la Guyane, avenue d'Estrée, BP 792, 97337 Cayenne Cedex, France
Аффилиация Primerose A.; Laboratoire de Traitement du Signal et de Modélisation des Machines, Institut d'Études Supérieures de la Guyane, avenue d'Estrée, BP 792, 97337 Cayenne Cedex, France
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