| Автор | Kanzari, M. |
| Автор | Abaab, M. |
| Автор | Rezig, B. |
| Автор | Brunel, M. |
| Дата выпуска | 1999 |
| dc.description | Thin amorphous CuInS<sub>2</sub> films were deposited on the glass substrates by single source thermal evaporation technique. The effect of heat treatments in sulfur atmosphere, in air and under vacuum on the surface layers is discussed in terms of the surface structure of the films. The films were examined by grazing X-ray diffraction and reflectometry (GXRD and GXRR). From a comparison with the GXRD results, the densities of the surface layers are explained by the presence of secondary phases. We established a correlation between stoichiometry and conductivity depending on the annealing conditions. |
| Формат | application.pdf |
| Издатель | EDP Sciences |
| Копирайт | © EDP Sciences, 1999 |
| Название | Surface effects of heat treatments in active atmosphere on structural, morphological and electrical characteristics of CuInS<sub>2</sub> thin films |
| Тип | research-article |
| DOI | 10.1051/epjap:1999163 |
| Electronic ISSN | 1286-0050 |
| Print ISSN | 1286-0042 |
| Журнал | The European Physical Journal Applied Physics |
| Том | 6 |
| Первая страница | 141 |
| Последняя страница | 146 |
| Аффилиация | Kanzari M.; Laboratoire de Photovoltaïque et Matériaux Semiconducteurs, ENIT, B.P. 37, Le Belvédère, 1002 Tunis, Tunisia |
| Аффилиация | Abaab M.; Laboratoire de Photovoltaïque et Matériaux Semiconducteurs, ENIT, B.P. 37, Le Belvédère, 1002 Tunis, Tunisia |
| Аффилиация | Rezig B.; Laboratoire de Photovoltaïque et Matériaux Semiconducteurs, ENIT, B.P. 37, Le Belvédère, 1002 Tunis, Tunisia |
| Аффилиация | Brunel M.; Laboratoire de Cristallographie, 25 avenue des Martyrs, 166X, 38042 Grenoble, France |
| Выпуск | 2 |
