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Автор Masini, A.
Автор Batani, D.
Автор Previdi, F.
Автор Milani, M.
Автор Pozzi, A.
Автор Turcu, E.
Автор Huntington, S.
Автор Takeyasu, H.
Дата выпуска 1999
dc.description Results obtained using a new technique for studying cell metabolism are presented. The technique, consisting in CO<sub>2</sub> production monitoring, has been applied to Saccharomyces cerevisiae yeast cells. Also the cells were irradiated using the soft X-ray laser-plasma source at Rutherford Appleton Laboratory with the aim of producing a damage of metabolic processes at the wall level, responsible for fermentation, without great interference with respiration, taking place in mitochondria, and DNA activity. The source was calibrated with PIN diodes and X-ray spectrometers and used Teflon stripes as target, emitting X-rays at about 0.9 keV, with a very low penetration in biological material. X-ray doses delivered to the different cell compartments were calculated following a Lambert-Bouguet-Beer law. Immediately after irradiation, the damage to metabolic activity was measured again by monitoring CO<sub>2</sub> production. Results showed a general reduction in gas production by irradiated samples, together with non-linear and non-monotone response to dose. There was also evidence of oscillations in cell metabolic activity and of X-ray induced changes in oscillation frequency.
Формат application.pdf
Издатель EDP Sciences
Копирайт © EDP Sciences, 1999
Название Yeast cell metabolism investigated by CO<sub>2</sub> production and soft X-ray irradiation
Тип research-article
DOI 10.1051/epjap:1999116
Electronic ISSN 1286-0050
Print ISSN 1286-0042
Журнал The European Physical Journal Applied Physics
Том 5
Первая страница 101
Последняя страница 109
Аффилиация Masini A.; Dipartimento di Fisica, Seconda Università di Milano Bicocca, via Emanueli 15, 20126 Milano, Italy ; INFM, Istituto Nazionale di Fisica della Materia, Milano, Italy
Аффилиация Batani D.; Dipartimento di Fisica, Seconda Università di Milano Bicocca, via Emanueli 15, 20126 Milano, Italy ; INFM, Istituto Nazionale di Fisica della Materia, Milano, Italy
Аффилиация Previdi F.; Dipartimento di Elettronica e Informazione, Politecnico di Milano, via Ponzio 34/5, 20133 Milano, Italy ; INFM, Istituto Nazionale di Fisica della Materia, Milano, Italy
Аффилиация Milani M.; Dipartimento di Scienza dei Materiali, Seconda Università di Milano Bicocca, via Emanueli 15, 20126 Milano, Italy ; INFM, Istituto Nazionale di Fisica della Materia, Milano, Italy
Аффилиация Pozzi A.; Dipartimento di Fisica, Seconda Università di Milano Bicocca, via Emanueli 15, 20126 Milano, Italy
Аффилиация Turcu E.; Rutherford Appleton Laboratory, Chilton Didcot, Oxon, OX11 OQX, UK
Аффилиация Huntington S.; Rutherford Appleton Laboratory, Chilton Didcot, Oxon, OX11 OQX, UK
Аффилиация Takeyasu H.; Rutherford Appleton Laboratory, Chilton Didcot, Oxon, OX11 OQX, UK
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