Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope*
Laddada, R.; Benrezzak, S.; Adam, P. M.; Viardot, G.; Bijeon, J. L.; Royer, P.; Laddada R.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France; Benrezzak S.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France; Adam P. M.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France; Viardot G.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France; Bijeon J. L.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France; Royer P.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France
Журнал:
The European Physical Journal Applied Physics
Дата:
1999
Аннотация:
We describe how a commercial silicon cantilever can be used both as a force probe and a local scatterer of light. This tip can thus be used as the key element of an apertureless Scanning Near-field Optical Microscope (SNOM) combined with an Atomic Force Microscope (AFM). We use a Total Internal Reflection (TIR) illumination to provide a Fresnel evanescent wave with well-defined characteristics. We show how the weak signal issued from the near-field scattered by the tip can be extracted from the background noise. Finally we present how a signal related to the near field can also be obtained when the tip is oscillated at a frequency close to the resonance frequency of the cantilever. These results are compared with a simulation of the lock-in detection. Finally we describe the role of the vibration amplitude on the signal.
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