| Автор | Laddada, R. |
| Автор | Benrezzak, S. |
| Автор | Adam, P. M. |
| Автор | Viardot, G. |
| Автор | Bijeon, J. L. |
| Автор | Royer, P. |
| Дата выпуска | 1999 |
| dc.description | We describe how a commercial silicon cantilever can be used both as a force probe and a local scatterer of light. This tip can thus be used as the key element of an apertureless Scanning Near-field Optical Microscope (SNOM) combined with an Atomic Force Microscope (AFM). We use a Total Internal Reflection (TIR) illumination to provide a Fresnel evanescent wave with well-defined characteristics. We show how the weak signal issued from the near-field scattered by the tip can be extracted from the background noise. Finally we present how a signal related to the near field can also be obtained when the tip is oscillated at a frequency close to the resonance frequency of the cantilever. These results are compared with a simulation of the lock-in detection. Finally we describe the role of the vibration amplitude on the signal. |
| Формат | application.pdf |
| Издатель | EDP Sciences |
| Копирайт | © EDP Sciences, 1999 |
| Название | Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope* |
| Тип | research-article |
| DOI | 10.1051/epjap:1999168 |
| Electronic ISSN | 1286-0050 |
| Print ISSN | 1286-0042 |
| Журнал | The European Physical Journal Applied Physics |
| Том | 6 |
| Первая страница | 171 |
| Последняя страница | 178 |
| Аффилиация | Laddada R.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France |
| Аффилиация | Benrezzak S.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France |
| Аффилиация | Adam P. M.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France |
| Аффилиация | Viardot G.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France |
| Аффилиация | Bijeon J. L.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France |
| Аффилиация | Royer P.; Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), Université de technologie de Troyes, 12 rue Marie Curie, B.P. 2060, 10010 Troyes Cedex, France |
| Выпуск | 2 |
