Focusing effect in X-ray diffraction imaging of LiNbO<sub>3</sub> crystals under static electric field
Pernot-Rejmánková, P.; Laprus, W.; Baruchel, J.; Pernot-Rejmánková P.; European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France; Laprus W.; Polish Academy of Sciences, Swietokrzyska 21, 00049 Warszawa, Poland; Baruchel J.; European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France
Журнал:
The European Physical Journal Applied Physics
Дата:
1999
Аннотация:
The X-ray diffracted intensity changes considerably when a static electric field is applied perpendicularly to a X- or Y-cut LiNbO<sub>3</sub> platelet-shaped crystal. Section diffraction images (topographs) recorded using synchrotron radiation in transmission mode reveal the curvature of the lattice planes under such a field. A theoretical analysis based on the equations of electro-mechanical field in a piezoelectric medium together with chemical etching experiments allows us to explain this effect. Tiny inverted ferroelectric doMayns produced by the applied field exert a strain on the non-inverted bulk leading to the observed curvature of the lattice planes. This approach seems to be valid for other piezoelectric crystals of various symmetry classes.
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