| Автор | Pernot-Rejmánková, P. |
| Автор | Laprus, W. |
| Автор | Baruchel, J. |
| Дата выпуска | 1999 |
| dc.description | The X-ray diffracted intensity changes considerably when a static electric field is applied perpendicularly to a X- or Y-cut LiNbO<sub>3</sub> platelet-shaped crystal. Section diffraction images (topographs) recorded using synchrotron radiation in transmission mode reveal the curvature of the lattice planes under such a field. A theoretical analysis based on the equations of electro-mechanical field in a piezoelectric medium together with chemical etching experiments allows us to explain this effect. Tiny inverted ferroelectric doMayns produced by the applied field exert a strain on the non-inverted bulk leading to the observed curvature of the lattice planes. This approach seems to be valid for other piezoelectric crystals of various symmetry classes. |
| Формат | application.pdf |
| Издатель | EDP Sciences |
| Копирайт | © EDP Sciences, 1999 |
| Название | Focusing effect in X-ray diffraction imaging of LiNbO<sub>3</sub> crystals under static electric field |
| Тип | research-article |
| DOI | 10.1051/epjap:1999249 |
| Electronic ISSN | 1286-0050 |
| Print ISSN | 1286-0042 |
| Журнал | The European Physical Journal Applied Physics |
| Том | 8 |
| Первая страница | 225 |
| Последняя страница | 232 |
| Аффилиация | Pernot-Rejmánková P.; European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France |
| Аффилиация | Laprus W.; Polish Academy of Sciences, Swietokrzyska 21, 00049 Warszawa, Poland |
| Аффилиация | Baruchel J.; European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France |
| Выпуск | 3 |
